Standards updates
Summaries of edition and test plan changes in the standards behind NFC and EMV payments, including ISO/IEC, EMVCo and NFC Forum. Standard names and Annex numbers are given as they appear in the source documents.
Towards 100% card personalisation QC — from offline inspection to inline QC
Conventional QC — first and last of a batch plus spot checks — cannot catch transposed data, wrong keys or faulty chips. This article sets out how an inline QC module inside the personalisation machine makes 100% inspection possible…
Read the article →Active load modulation (ALM) and wider test coverage for NFC devices — phase drift immunity testing
ALM, used by NFC devices with small antennas, can cause reception errors through phase drift. This illustrated article covers device immunity testing using the Active Reference PICC of ISO/IEC 10373-6 Edition 4 and the Quest PCD Phase Drift Immunity tool…
Read the article →Micropross end of life and rebuilding the NFC test environment — migrating to the KEOLABS platform
Following NI's announcement, Micropross products are at end of life, which constrains new procurement and long-term maintenance. Existing equipment can be kept running through FIME, but for new environments we recommend rebuilding around ProxiLAB Quest, ProxiSPY Quest and SCRIPTIS™…
Read the article →Level 1 testing for EMVCo Reduced Range terminals — Bulletin No.276 and acceptance criteria scoring
Testing a Reduced Range terminal takes two parts: PCD L1 Analogue Test Cases v3.2a and RR L1 Test Guidelines v3.2a. Bulletin No.276, issued in April 2024, defines the acceptance criteria, and verdicts are produced with an EMVCo qualified scoring tool…
Read the article →The ISO/IEC 10373-6:2025 (Edition 5) test plan — what changed
ISO/IEC 10373-6 defines test methods specific to the proximity cards and objects, proximity coupling devices (PCDs) and proximity extension devices described in ISO/IEC 14443. Between the 2020 and 2025 editions…
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