Keolabs reference antennas and test fixtures
Reference antennas and test fixtures designed by KEOLABS, as a test tool supplier, against specifications including EMVCo, NFC Forum, ICAO, CEN TS 16794 and ISO/IEC 10373-6. Each antenna follows the technical requirements of its specification as closely as possible. These are not accessories: they are test components that define the RF environment on the opposite side of the device under test, covering coupling conditions, physical position, signal quality and reproducibility.
The test bench as a whole
A test bench has four elements: software, tester, fixtures and the device under test. This shows where the product sits.
What they define
Reference antennas and test fixtures designed by KEOLABS, as a test tool supplier, against specifications including EMVCo, NFC Forum, ICAO, CEN TS 16794 and ISO/IEC 10373-6. Each antenna follows the technical requirements of its specification as closely as possible. These are not accessories: they are test components that define the RF environment on the opposite side of the device under test, covering coupling conditions, physical position, signal quality and reproducibility.
The reference environment on the far side of the device under test
Reference antennas and fixtures are not accessories. They form the RF environment on the opposite side of the device under test and define coupling conditions, physical position, signal quality and reproducibility. When testing a PICC you use the reference on the PCD side; when testing a PCD you use the reference on the PICC side.
| Device under test | Typical reference-side components required |
|---|---|
| Testing a PICC or card | References on the PCD side: EMVCo Test PCD and ISO PCD Assembly |
| Testing a PCD or reader | References on the PICC side: EMVCo Test PICC and REFPICC by class |
| Testing a VICC or ISO/IEC 15693 device | REFVICC, PCD Assembly ISO15693 |
| Testing an NFC Poller or Listener | Reference antennas on the opposite side: Poller-Listener Kit and NFC Forum Kit |
Reference accessories and fixtures (actual SKUs)
Reference antennas, assemblies, reference PICCs and calibration components, by specification. What each kit contains, and the current SKUs, are confirmed at the time of order.
EMVCo accessories
| SC-EMVCo Test PICC V3.0 | A kit of three EMVCo PICCs: two Class 1 tuned to 13.56 and 16.1 MHz, and one Class 3 tuned to 13.56 MHz |
|---|---|
| SC-EMVCo Test PCD V3.0 | One EMVCo PCD antenna |
SC-EMVCo KIT
| SC-EMVCo KIT | Three reference PICCs, the PCD antenna, a stand with stackers for mounting the Test PCD, and a CMR for signal conditioning and input/output switching |
|---|
ISO accessories for cards (PCD Assembly)
| SC-PCD Assembly -4R7 (ISO PCD Assembly 1) | ISO/IEC 10373-6 Test PCD Assembly 1 for Classes 1 to 3. It contains three matching networks (Rext 4.7 Ω, 0.94 Ω and bypass), selectable automatically or manually. Conforms to ISO/IEC 10373-6:2020 |
|---|---|
| SC-PCD Assembly -1R (ISO PCD Assembly 1) | ISO/IEC 10373-6 low-speed Test PCD Assembly (Rext 1 Ω), for Level 1 ISO/IEC 14443 alternating field testing |
| SC-PCD Assembly -2R7 | ISO/IEC 10373-6 Test PCD Assembly 2 for Classes 4 to 6. It contains three matching networks (Rext 2.7 Ω, 0.54 Ω and bypass). Conforms to ISO/IEC 10373-6:2020 |
| SC-PCD Assembly ISO15693 | ISO/IEC 10373-7 Test VCD Assembly: antenna and sensing coil for testing cards implementing ISO/IEC 15693 |
ISO accessories for readers (REFPICC and REFVICC)
| SC-REFPICC-CLASS1 | ISO/IEC 10373-6 PICC Reference Probe (Class ID-1), for testing contactless readers |
|---|---|
| SC-REFPICC-KIT-CLASS1-3 | PICC Reference probe Kit (Class 1-3) |
| SC-REFPICC-KIT-CLASS4-6 | PICC Reference probe Kit (Class 4-6) |
| SC-REFVICC | ISO/IEC 15693 VICC Reference Probe, for testing ISO/IEC 15693 readers |
NFC Forum accessories
| SC-Poller-Listener-kit | Poller and Listener reference antennas for testing NFC objects and systems |
|---|---|
| SC-NFC Forum Kit | Poller and Listener antennas, a calibration test bench, and the KEOKLAMP that holds the antenna and the device |
Other accessories
| Micro Nano Sim Flex KIT | Four 3FF micro SIM probes, four 4FF nano SIM probes, and an extra-long Nano SIM R1 |
|---|---|
| Inter-connection Cables | SMA-to-SMA platform cables, 50 cm and 100 cm |
| SC-RF Probe 4 V1.3 | An RF probe for mobile phones and non-standard form factors |
Specifications and schemes
Reference fixtures for each specification (coverage depends on the configuration and licences)
Notes on use
The antennas follow the technical requirements of their specifications — EMVCo, NFC Forum, ICAO, CEN TS 16794 and ISO/IEC 10373-6. When testing a PICC use the reference on the PCD side; when testing a PCD use the reference on the PICC side. PCD Assemblies differ in purpose by their Rext value: 4.7 Ω for high-speed Level 2, 1 Ω for low-speed Level 1 alternating field testing. What each kit contains, and the current SKUs, are confirmed at the time of order.